Overview: We have developed an accurate fault modeling tool to capture variation-induced faults in Networks-on-Chip (NoCs). The core of our fault model has circuit-level accuracy, while its ...

A different set of fault models and testing techniques is required for memory blocks vs. logic. MBIST algorithms that are used to detect faults inside memory are based upon these fault models. This ...

A team of scientists in the United States has combined both spatial and temporal attention mechanisms to develop a new approach for PV inverter fault detection. Training the new method on a dataset ...

Traditional IC pattern-generation methods focus on detectingdefects at gate terminals or at interconnects. Unfortunately, a significantpopulation of defects may occur within an IC's gates, or cells.