A new method in electron microscopy enables sub-20-picometer targeting of individual atoms without prior exposure, opening the door to atom-specific analysis and control. (Nanowerk Spotlight) ...
New ion beam fabrication uses low cost materials to form vertical nanomagnets whose nanostrip geometry boosts sensitivity to magnetic fields and current pulses. (Nanowerk News) Researchers at HZDR ...
Electron-beam inspection is proving to be indispensable for finding critical defects at sub-5nm dimensions. The challenge now is how to speed up the process to make it economically palatable to fabs.
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